[Crystallography Online] Crystallography Online

Dr. M. Ermrich


X- Ray Diffraction

  • Qualitative and quantitative phase analysis
  • Cristallinity, crystallite size / strain
  • Stress and texture determination
  • Investigation of thin layers
  • High temperature measurements

Consultation

  • Optimization of X-ray methods, devices and additional tools
  • Special problems / measurements of comparison
  • in preparation for buying an X- ray diffractometer

Seminars / lectures

X- Ray diffraction

Devices, measurement optimization, sample preparation....

Equipment

theta/theta- Diffractometer

  • Thin film attachment
  • Eulerian cradle
  • High temperature attachment (1600C)

theta/2theta- Diffractometer

  • Routine analysis
  • Sample changer

Transmission diffractometer

  • Thin foils, small sample amounts, capillary technique
  • High temperature attachment (900C)

Westring 80
(Postfach 4108)
D - 64354 Reinheim near Darmstadt
Germany

Phone/Fax: 49 (6162) 837 56


16th June 1998 - Crystallographic Resources and Information Online - Copyright © International Union of Crystallography